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Tuesday, June 4th, 2007

Eureka-2 info

CST is proud to present the next generation of Eureka tester capable of testing DDR,DDR2 & DDR3 in blazing speed. The Eureka2 is the fourth generation Bench-Top DIMM / SODIMM test system specifically designed for high-volume memory distributors, memory module manufacturers, memory module design engineers, DRAM Test Labs and other PC manufacturers.

With progressive engineering and state-of-the-art technology, the Eureka-2 memory test system was created to be the industry testing standard for the next decade. Designed with R&D engineers, QA/QC engineers and module manufacturers in mind, the Eureka-2 's rugged, heavy duty construction was developed to endure the rigors of high volume testing

The Eureka2 Advanced Memory Tester can support DDR1, DDR2 & DDR3 memory with a change of optional adapters. Future memory such as Nand Flash, Nor Flash and MCPs will be offer on the Eureka2 tester.

With the new DDR3 Test Solution, Eureka2 DDR3 tests adapter supports testing DDR3 SDRAM DIMM modules starting from 800Mhz ~ 1400Mhz Data Rate. Leakage testing option is offered as a standard DC parametric feature test for all DDR, DDR & DDR3 module.

CST will offer a DDR3 Test Solution on the Eureka2 with an optional adapter which will support DDR3 DIMM module from 800Mhz to 1333 Mhz data-rate.

The Eureka-2 is indeed, the most versatile and powerful memory module tester for the module manufacturers and distributors. Additional future optional capability includes Flash testing, DDR2 TSOP/BGA Chips, DDR2 BGA Chips, DDR3 BGA Chips & MCP testing will be available.

Advanced Test Algorithms

The Eureka-2 performs fast functional test ensuring module work in the final system environment. Multiple user Defined test patterns are used to detect shorts and opens. Comprehensive test cycles out soft failures including single cell failure, cross-cell-contamination, intermittent failure as well as timing and noise related errors.

DC-Parametric Test

Leakage testing is offered as a standard feature and use for semiconductor leakage testing characteristics. The Eureka2 test can detect minute leakage current that can lead to infant mortality on any type of DRAM chips.

SPD Programming

The tester is built-in with SPD (serial presence detect) programmer to program and verify SPD contents on the same pass as the module is being tested.

Enhancement Features

A few enhancement features are provided to streamline test accuracy. These are chip-heating, voltage bouncing, loop test, adjustable timing parameters (selected), alterable refresh mode and cycle, refresh test, 7- ICC measurement, as well as Shmoo Plot and error capture capabilities. It also supports buffered or unbuffered modules with parity and ECC bits.

Ease of Use

This bench top DIMM/SODIMM tester is designed for all situations. While for the high volume production setting, an ideal solution is to interface the Eureka-2 with CST's new RoboFlex-1 and RoboFlex-2 Automatic DIMM/SODIMM Handler for hands-free testing. In all cases, the latest software enhancement and upgrade can be downloading from CST website at no additional charge.

 

Eureka2 DDR2 800Mhz Tester Solutions

 

 

Eureka2 "DDR2" Memory Tester

The Eureka2 test architecture offers "Real-Time & At Speed Testing" for  DDR2 SDRAM Module. The Eureka2 is the most the advanced , comprehensive and accurate memory tester with the lowest possible testing cost for DDR2 Memory Modules. Existing users of Eureka testers will be familiar with the new Eureka2 tester user interface. The Eureka2 DDR2 Tester covers all the basic open and short test, functional test and DC parametric test and is available for shipment now.

Eureka2 DDR2 supports 400,533,667 & 800Mhz Data-rate 240 Pin Unbuffered & Registered DIMM & Unbuffered SODIMM. 

Note : Notebook & PC not included

  • Support up to 4 Ranks DIMM & 72 bit
  • Accurate Automatic Identification of DDR2 memory size , data bitů..etc
  • Enhance Advanced Test Pattern ( 25 Advanced Marching Pattern)
  • Wide Vdd Voltage range setting (1.5 ~2.4V)- suitable for Over-Clocking module
  • 7-ICC measurement & DIMM Draw Editor
  • DC Parametric Testing 
  • Programmable Timing adjustment
  • Capable to support 4 Rank Module Testing
  • Extremely Fast Test time ( Marching Test for 512Mb in 15 seconds)
  • Speed Sorting
  • IC Chip Sorting Capability
  • SPD Programming Capability (RSWP & Soft Write Protect)
  • Interface to all CST Automatic Handler
Eureka2 DDR 500 MhzTester Solutions

Eureka2 "DDR" Memory Tester

The Eureka2 test architecture offers "Real-Time & At Speed Testing" for  the 184pin DDR SDRAM Module. The Eureka2 is the most the advanced , comprehensive and accurate memory tester with the lowest possible testing cost for DDR2 Memory Modules. Existing users of Eureka testers will be familiar with the new Eureka2 tester user interface. The Eureka2 DDR Tester covers all the basic open and short test, functional test and DC parametric test is available for shipment now

Eureka2 DDR supports 200,333,400 & 500Mhz data rate 184pin DIMM & 200pin SODIMM.

Note : Notebook & PC not included

  • Extremely Fast Test time ( Marching Test for 512Mb in 15 seconds)
  • Support up to 2 Ranks DIMM & 72 bit
  • Accurate Automatic Identification of DDR memory size , data bitů..etc
  • Enhance Advanced Test Pattern ( 25 Advanced Marching Pattern)
  • Wide Vdd Voltage range setting (2.3 ~3.4V)- suitable for Over-Clocking module
  • 7-ICC measurement & DIMM Draw Editor
  • DC Parametric Testing 
  • Programmable Timing adjustment
  • Module Speed Sorting
  • IC Chip Sorting Capability
  • SPD EEPROM Programming Capability (RSWP & Soft Write Protect)
  • Interface to all CST Automatic Handler
CST Inc. Memory Tester DDR/DDR2/DDR3 Tester
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