Industry News
CST News
Member Area
Tester Brochure
Demo Library
Tester FAQs

biology medicine news product technology definition

Tuesday, September 18, 2018
CST News Release
Email ArticlePrinter Format PreviousNext

MS-100D DIE Sorting Tester

Friday, May 05, 2017

CST Inc., a Memory Tester Company has announced its New MS-100D DIE Sorting Tester and have started deploying hundreds of units at several major DIE Sorting Manufacturers world-wide. MS-100D has a very good architecture, with different probe card the same tester is able to test almost all DRAM DIE on the market, specially Mobile Low Power DRAM: LPDDR2, LPDDR3 & LPDDR4.

Innovative DIE Sorting Solution

MS-100D is cost effective, high performing DIE Sorting solution. With changeable probe card MS-100D is able to test various DIE: LPDDR4/3/2, DDR4/3. So far we already provided customer below DIE solution

Fast Development Time

- MS-100D is FPGA-Based tester, CST has more than 30 years’ experience on memory testing, and has memory controller for almost all DRAN devices on the market.

- Simple Probe Card design - only probe and connector

- Lead-time for a new DIE is 4-6 weeks

Fast test time, high FT good percentage

Support DQ BIN Sorting

Small form-factor size and works with different probe card station

Easy to align Probe & DIE PAD

Easy to us.

- MS-100D has Start Button, 1-click-to-run
- Detail & clear result display

For further information, visit or call our Sales at (972)241-2662 x312.

Address: 2336 Lu Field Road , Dallas, Texas 75229 USA
Tel : (972)-241-2662
Fax : (972)-241-2661
Email :

By: DocMemory
Copyright © 2017 CST, Inc. All Rights Reserved

Email ArticlePrinter Format PreviousNext
Latest CST News
MS-100D DIE Sorting Tester5/5/2017
CST Start to Deliver Eureka 2400 DDR4 Memory Tester4/5/2016
CST Enables Memory Market with New DDR4 Tester8/28/2014
CST launch Eureka2s Mobile Memory Tester for testing Multi-Chip-Package (MCP) memory.12/16/2013
CST to unveil the Dual Test Socket 2133Mhz DDR3 DIMM/SODIMM Tester at the Semicon Taiwan Show.8/13/2013
CST Inc first to ship DDR4 DIMM/SODIMM Memory Module SPD EEPROM Programmer8/8/2013
CST launch Improved DDR4/DDR3 Server DIMM Memory Burn-in System at Semicon Taiwan8/1/2013
CST unveil Dual Test Socket DDR3 DIMM/SODIMM Tester2/20/2013
High-Performance Advantest Automatic Handler + CST DDR3 & Mobile DRAM Chip Testers for Total Testing Solution.10/15/2012
CST unveil the DDR3 BGA Chip Test Handler at Semicon Taiwan 201210/15/2012

CST Inc. Memory Tester DDR Tester
Copyright © 1994 - 2018 CST, Inc. All Rights Reserved